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DESY News: New focused ion beam strengthens nano and high-pressure science
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News from the DESY research centre
New focused ion beam strengthens nano and high-pressure science
A new “nano scalpel” enables scientists at DESY to prepare samples or materials with nanometre precision while following the process with a scanning electron microscope. The Focused Ion Beam, or FIB, microscope which has now gone into service also allows a detailed view of the inner structure of materials. The device was purchased by the University of Bayreuth, as part of a joint research project on the DESY campus funded by the Federal Ministry of Research. The FIB will be operated at the DESY NanoLab jointly with the University of Bayreuth.
![](https://www.desy.de/e409/e116959/e119238/media/3887/Ball-2-ion_20_thumbnail_thumbnail.jpg)
Preparation of a double-staged diamond anvil cell with the focused ion beam microscope. Credit: Leonid Dubrovinsky, Universität Bayreuth
![](https://www.desy.de/e409/e116959/e119238/media/3891/Dubrovinskaia_Keller_FIB_thumbnail_thumbnail.jpg)
Natalia Dubrovinskaia and Thomas Keller in front of the new focused ion beam microscope at DESY. Credit: Sylvain Petitgirard, Universität Bayreuth
In addition, the device allows researchers to investigate the chemical composition of samples by measuring fluorescent radiation. “Together with the built-in milling machine, we can not only determine the three-dimensional structure, but also the distribution of the elements beneath the surface by alternately removing material and carrying out a chemical analysis, much like in 3D tomography,” adds Thomas Keller who heads the sub-division microscopy and nano structuring at the DESY NanoLab.