Date |
Speaker |
Content |
23_02_2011 |
Daniel Pitzl, Alexey Petrukhin |
Pixel testboard software, hardware, first psi46 ROC plots
|
08_03_2011 |
Daniel Pitzl, Alexey Petrukhin |
Software progress, power, timing, working point, thresholds
|
31_05_2011 |
Alexey Petrukhin, Daniel Pitzl |
Chip parameters tuning, individual chip tests, ROC with sensor
|
09_08_2011 |
Daniel Pitzl, Aleksander Gajos |
Ru source tests, trigger modes, first results with takeData program
|
23_08_2011 |
Aleksander Gajos, Daniel Pitzl |
Pixel cluster analysis, sensor bias voltage scan, threshold scan
|
06_09_2011 |
Daniel Pitzl, Aleksander Gajos, Alexey Petrukhin, Fedor Glazov |
DESY beam test of CMS pixel detectors: setup, single runs, scans
|
23_09_2011 |
Alexey Petrukhin, Daniel Pitzl, Aleksander Gajos, Fedor Glazov |
Pixel threshold trimming procedure, noise, gain calibration, GUI
|
18_10_2011 |
Daniel Pitzl |
Pixel test plans
|
01_11_2011 |
Alexey Petrukhin
Daniel Pitzl |
Double Columns, V scan, threshold scan, UB level, data taking eff., bump bonding test
New pixel test board adapter
|
15_11_2011 |
Alexey Petrukhin
Daniel Pitzl |
Threshold scan update, time walk, data buffer test, cross talk capacitance
Pixel test plans
|
29_11_2011 |
Alexey Petrukhin, Daniel Pitzl |
ROC functionality, DAC correlations, trimming and time walk, PH for different DACs, control plots for charge injection
|
20_12_2011 |
Daniel Pitzl |
CMS pixel in EUDET telescope: tilted pixels, resolutions, correlations
|
03_01_2011 |
Daniel Pitzl |
CMS pixel resolution in the DESY test beam: alignment, tilted pixels, resolution, charge sharing
|
17_01_2012 |
Alexey Petrukhin, Daniel Pitzl
Daniel Pitzl |
Noise test, CalDel and VthrComp eff., T test, VhldDel optimization, Vcal lin. range, Vsf optimization
Pixel test plans 2012
|
25_01_2012 |
Alexey Petrukhin
Daniel Pitzl |
Summary of lab. tests for PSI
Summary of beam tests for PSI
|
10_02_2012 |
Daniel Pitzl |
New ROC design, beam tests, plans
|
24_02_2012 |
Alexey Petrukhin
Daniel Pitzl |
Module tests: power, CalDel and time walk, threshold scan, trimming
Efficiency studies in the test beam: track selection, first eff., timing
|
09_03_2012 |
Alexey Petrukhin
Daniel Pitzl |
Module tests: progress in threshold optimization
Multiple scattering and GBL in test beam: General Broken Lines, resolution vs momentum, scattering plates inserted
|
23_03_2012 |
Alexey Petrukhin |
X-ray test overview
|
11_04_2012 |
Daniel Pitzl
Daniel Pitzl |
Pixel beam test April 2012: Goals, setup, planning
Cluster charge studies
|
20_04_2012 |
Alexey Petrukhin
Daniel Pitzl |
New X-ray tests: spectrum, map, bias V scan, gain calibration
Preparations for Pixel beam test April 2012
|