GENNESYS Foresight Study

H. Dosch and M.H. Van de Voorde
Study on Nanoscience and Nanotechnology in Europe exploiting Synchrotron Radiation and Neutron Facilities
Max-Planck-Institut für Metallforschung, Stuttgart (2009)
ISBN 978-3-00-027338-4
Order:
Please contact Mrs. Sabine Berger: sabine.berger@desy.de

Zukunftsmaschinen

H. Dosch, H. Fueß, G.E. Morfill, R. Sauerbrey, A. Schäfer, E. Umbach, D. Wegener
Zukunftsmaschinen
Deutsche Physikalische Gesellschaft e.V. (2003)

Download:
ZukunftsmaschinenDPG2003.pdf

European Whitebook

M.Rühle, H.Dosch, E.Mittemeijer, M.H. van de Voorde
European Whitebook on Fundamental Research in Materials Science
Max-Planck-Institut für Metallforschung, Stuttgart (2000)
ISBN 3-00-008806-7

Order:
Please contact Claudia Sussdorff (Claudia.Sussdorff@mf.mpg.de)

Critical Phenomena at Surfaces and Interfaces

H. Dosch
Critical Phenomena at Surfaces and Interfaces: Evanescent x-ray and neutron scattering
Springer Tracts in Modern Physics 126 (1992)

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Artikel

F. U. Renner, A. Stierle, H. Dosch, D. M. Kolb, T.-L. Lee, and J. Zegenhagen
Initial corrosion observed on the atomic scale
Nature 439, 707-710 (2006)

H. Reichert, O. Klein, H. Dosch, M. Denk, V. Honkimäki, T. Lippmann and G. Reiter
Observation of five-fold local symmetry in liquid lead
Nature 408, 839-841 (2000)

P. Nolte, A. Stierle, N. Y. Jin-Phillip, N. Kasper, T. U. Schulli, H. Dosch
Shape Changes of Supported Rh Nanoparticles During Oxidation and Reduction Cycles
Science 321, 1654-1658 (2008)

M. Mezger, H. Schröder, H. Reichert, S. Schramm, J.S. Okasinski, V. Honkimäki, M. Deutsch, B.M. Ocko, J. Ralston, M. Rohwerder, M. Stratmann, H. Dosch
Molecular Layering of Fluorinated Ionic Liquids at a Charged Sapphire (0001) Surface
Science 322, 424-228 (2008)

C. Mocuta, H. Reichert, K. Mecke, H. Dosch, and M. Drakopoulos
Scaling in the Time Domain: Universal Dynamics of Order Fluctuations in Fe3Al
Science 308, 1287-1291 (2005)

A. Stierle, F. Renner, R. Streitel, H. Dosch, W. Drube, and B. C. Cowie
X-ray diffraction study of the Al2O3 layer on NiAl(110)
Science 303, 1652 (2004)

M. Mezger, H. Reichert, S. Schöder, J. Okasinski, H. Schröder, H. Dosch, D. Palms, J. Ralston, and V. Honkimäki
High-resolution in situ x-ray study of the hydrophobic gap at the water-octadecyl-trichlorosilane interface
Proceedings of the National Academy of Sciences (PNAS) 103, 18401-18404 (2006)

P. Wochner, C. Gutt, T. Autenrieth, T. Demmer, V. Bugaev, A. Díaz Ortiz, A. Duri, F. Zontone, G. Grübel, H. Dosch
X-ray Cross Correlation Analysis Uncovers Hidden Local Symmetries in Disordered Matter
Proceedings National Academy of Sciences (PNAS) 106, 11511-11514 (2009)

M. Schmid, A. Reicho, A. Stierle, I. Costina, J. Klikovits, P. Kostelnik, O. Dubay, G. Kresse, J. Gustafson, E. Lundgren, J. N. Andersen, H. Dosch, and P. Varga
Structure of Ag(111)-p(4 x 4)-O: no silver oxide
Physical Review Letters 96, 146102-1-4 (2006)

S. Engemann, H. Reichert, H. Dosch, J. Bilgram, V. Honkimäki, and A. Snigirev
Interfacial melting of ice in contact with SiO2
Physical Review Letters 92, 205701 (2004)

E. Lundgren, J. Gustafson, A. Mikkelsen, J. N. Andersen, A. Stierle, H. Dosch, M. Todorova, J. Rogal, K. Reuter and M. Scheffler
Kinetic hindrance during the initial oxidation of Pd(100) at ambient pressures
Physical Review Letters 92, 046101-1-1-4 (2004)

A. C. Dürr, F. Schreiber, K. A. Ritley, V. Kruppa, J. Krug, H. Dosch, and B. Struth
Rapid roughening in thin film growth of the organic semiconductor diindenoperylene (DIP)
Physical Review Letters 90, 016104 (2003)

H. Reichert, P. Eng, H. Dosch, and I. K. Robinson
Thermodynamics of Surface Segregation Profiles at Cu3Au(001) Resolved by X-ray Scattering
Physical Review Letters 74, 2006 (1995)

A. Lied, H. Dosch, and J. H. Bilgram
Surface Melting of Ice Ih Single Crystals Revealed by Glancing Angle X-ray Scattering
Physical Review Letters 72, 3554-3557 (1994)

L. Mailänder, H. Dosch, J. Peisl, and R. L. Johnson
Near-Surface Critical X-Ray Scattering from Fe3Al
Physical Review Letters 64 , 2527-2530 (1990)

H. Dosch, L. Mailänder, A. Lied, J. Peisl, F. Grey, R. L. Johnson and S. Krummacher
Experimental Evidence for an Interface Delocalization Transition in Cu3Au
Physical Review Letters 60, 2382-2385 (1988)

H. Dosch, B. W. Batterman, and D. C. Wack
Depth-Controlled Grazing-Incidence Diffraction of Synchrotron X Radiation
Physical Review Letters 56, 1144-1147 (1986)

M. Mezger, F. Sedlmeier, D. Horinek, H. Reichert, D. Pontoni, H. Dosch
On the origin of the hydrophobic water gap: An x-ray reflectivity and MD simulation study
Journal of the American Chemical Society (JACS) 132, 6735-5741 (2010)

R.Weitz, K. Amsharov, U. Zschieschang, E. Barrena, D. Goswani, M. Burghard, H. Dosch, M. Jansen, K. Kern, H. Klauk
Organic n-Channel Transistors Based on Core-Cyanated Perylene Carboxylic Diimide Derivatives
Journal of the American Chemical Society 130, 4637-4645 (2008)

D. G. de Oteyza, E. Barrena, J. O. Osso, S. Sellner, and H. Dosch
Thickness-dependent structural transitions in fluorinated copper-phthalocyanine (F16CuPc) films
Journal of the American Chemical Society 128, 15052-15053 (2006)