mptest2.f90 File Reference

MC for simple 10 layer silicon strip tracker. More...

Go to the source code of this file.

Modules
module	mptest2
	Parameters and data.

Functions/Subroutines
subroutine	mptst2 (imodel)
	Generate test files. More...
subroutine	genln2 (ip)
	Generate line and measurements. More...

Variables
integer(mpi), parameter	mptest2::nlyr =10
	number of detector layers More...
integer(mpi), parameter	mptest2::nmlyr =14
	number of measurement layers More...
integer(mpi), parameter	mptest2::nmx =10
	number of modules in x direction More...
integer(mpi), parameter	mptest2::ncx =5
	center (vertical/x) row (used in cons.) More...
integer(mpi), parameter	mptest2::nmy =5
	number of modules in y direction More...
integer(mpi), parameter	mptest2::ntot =nlyr*nmx*nmy
	total number of modules More...
real(mps), parameter	mptest2::dets = 10.0
	arclength of first plane More...
real(mps), parameter	mptest2::diss = 10.0
	distance between planes More...
real(mps), parameter	mptest2::thck = 0.02
	thickness of plane (X0) More...
real(mps), parameter	mptest2::offs = 0.5
	offset of stereo modules More...
real(mps), parameter	mptest2::stereo =0.08727
	stereo angle More...
real(mps), parameter	mptest2::sizel = 20.0
	size of layers More...
real(mps), parameter	mptest2::sigl =0.002
integer(mpi)	mptest2::nhits
	number of hits More...
real(mps)	mptest2::the0
	multiple scattering error More...
integer(mpi), dimension(nmlyr)	mptest2::islyr
	(detector) layer More...
integer(mpi), dimension(nmlyr)	mptest2::ihits
	module number More...
real(mps), dimension(ntot)	mptest2::sdevx
	shift in x (alignment parameter) More...
real(mps), dimension(ntot)	mptest2::sdevy
	shift in y (alignment parameter) More...
real(mps), dimension(nmlyr)	mptest2::sarc
	arc length More...
real(mps), dimension(nmlyr)	mptest2::ssig
	resolution More...
real(mps), dimension(2, nmlyr)	mptest2::spro
	projection of measurent direction in (XY) More...
real(mps), dimension(nmlyr)	mptest2::xhits
	position perp. More...
real(mps), dimension(nmlyr)	mptest2::yhits
	measured position in plane (hit) More...
real(mps), dimension(nmlyr)	mptest2::sigma
	measurement sigma (hit) More...

Detailed Description

MC for simple 10 layer silicon strip tracker.

Author

Claus Kleinwort, DESY, 2009

Copyright

Copyright (c) 2009 - 2022 Deutsches Elektronen-Synchroton, Member of the Helmholtz Association, (DESY), HAMBURG, GERMANY

This library is free software; you can redistribute it and/or modify it under the terms of the GNU Library General Public License as published by the Free Software Foundation; either version 2 of the License, or (at your option) any later version.

This library is distributed in the hope that it will be useful, but WITHOUT ANY WARRANTY; without even the implied warranty of MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU Library General Public License for more details.

You should have received a copy of the GNU Library General Public License along with this program (see the file COPYING.LIB for more details); if not, write to the Free Software Foundation, Inc., 675 Mass Ave, Cambridge, MA 02139, USA.

No B-field, straight tracks. Selected with command line option '-t=track-model' The track-models differ in the implementation of multiple scattering (errors):

• SL0: Ignore multiple scattering. Fit 4 track parameters.
• SLE: Ignore correlations due to multiple scattering, use only diagonal of m.s. covariance matrix. Fit 4 track parameters.
• BP: Intoduce explicit scattering angles at each scatterer. Fit 4+2*(nmlyr-2) parameters. Matrix of corresponding linear equation system is full and solution is obtained by inversion (time ~ parameters^3).
• BRLF: Use (fine) broken lines (see References). Multiple scattering kinks are described by triplets of offsets at scatterers as track parameters. Fit 4+2*(nmlyr-2) parameters. Matrix of corresponding linear equation system has band structure and solution is obtained by root-free Cholesky decomposition (time ~ parameters).
• BRLC: Use (coarse) broken lines. Similar to BRLF, but with stereo layers combined into single layer/scatterer. Fit 4+2*(nlyr-2) parameters.

MC for simple silicon strip tracker:

• 10 silicon detector layers
• 50 modules per layer (2*4cm)
• 10 cm spacing, no B-field
• layers 1,4,7,10 have additional +/-5deg stereo modules
• intrinsic resolution 20mu, 2% X0 per strip module
• uniform track offsets/slopes
• momentum: log10(p) 10..100 GeV uniform

Global parameters:

• Position offsets (2D) in measurement plane per module (alignment).

Definition in file mptest2.f90.

Function/Subroutine Documentation

genln2()

subroutine genln2

(

integer(mpi), intent(in)

ip

)

Generate line and measurements.

Parameters

[in]

ip

print flag

Definition at line 435 of file mptest2.f90.

References mptest2::ihits, mptest2::islyr, mptest2::nhits, mptest2::nmlyr, mptest2::nmx, mptest2::nmy, mptest2::sarc, mptest2::sdevx, mptest2::sdevy, mptest2::sigma, mptest2::sizel, mptest2::spro, mptest2::ssig, mptest2::the0, mptest2::xhits, and mptest2::yhits.

Referenced by mptst2().

mptst2()

subroutine mptst2

(

integer(mpi), intent(in)

imodel

)

Generate test files.

Create text and binary files.

 unit  8: textfile mp2str.txt   = steering file
 unit  9: textfile mp2con.txt   = constraint file
 unit 51: binary file mp2test.bin, written using CALL MILLE(.)
 existing file are removed

Parameters

[in]

imodel

track model 0: 'straight line', ignoring multiple scattering 1: 'straight line', using diagonal of m.s. error matrix 2: 'break points' 3: 'broken lines', fine 4: 'broken lines', coarse (stereo layers combined)

Definition at line 111 of file mptest2.f90.

References mptest2::dets, mptest2::diss, endle(), genln2(), mptest2::ihits, mptest2::islyr, mille(), mptest2::ncx, mptest2::nhits, mptest2::nlyr, mptest2::nmx, mptest2::nmy, mptest2::offs, mptest2::sarc, mptest2::sdevx, mptest2::sdevy, mptest2::sigl, mptest2::sigma, mptest2::spro, mptest2::ssig, mptest2::stereo, mptest2::thck, mptest2::the0, mptest2::xhits, and mptest2::yhits.

Referenced by filetc().